Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM /
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further deta...
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| Formato: | Electrónico eBook |
| Idioma: | inglés |
| Publicado: |
Tokyo :
Springer Japan : Imprint: Springer,
2024.
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| Edición: | 2nd ed. 2024. |
| Subjects: | |
| Acceso en liña: | https://doi.org/10.1007/978-4-431-56940-4 |
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