Delwedd Flaen

Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM /

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further deta...

Disgrifiad llawn

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Tanaka, Nobuo (Awdur)
Awdur Corfforaethol:	SpringerLink (Online service)
Fformat:	Electronig eLyfr
Iaith:	Saesneg
Cyhoeddwyd:	Tokyo : Springer Japan : Imprint: Springer, 2024.
Rhifyn:	2nd ed. 2024.
Pynciau:	Materials > Microscopy. Materials > Analysis. Imaging systems. Spectrum analysis. Nanoscience. Microscopy. Imaging Techniques. Characterization and Analytical Technique. Spectroscopy. Nanophysics.
Mynediad Ar-lein:	https://doi.org/10.1007/978-4-431-56940-4
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

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