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Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM /

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further deta...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijä: Tanaka, Nobuo (Tekijä)
Yhteisötekijä: SpringerLink (Online service)
Aineistotyyppi: Elektroninen E-kirja
Kieli:englanti
Julkaistu: Tokyo : Springer Japan : Imprint: Springer, 2024.
Painos:2nd ed. 2024.
Aiheet:
Materials > Microscopy.
Materials > Analysis.
Imaging systems.
Spectrum analysis.
Nanoscience.
Microscopy.
Imaging Techniques.
Characterization and Analytical Technique.
Spectroscopy.
Nanophysics.
Linkit:https://doi.org/10.1007/978-4-431-56940-4
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Sisällysluettelo:
  • Chapter 1 Seeing nanometer-sized world
  • Chgapter 2 Structure and imaging of a transmission electron microscope (TEM)
  • Chapter 3 Basic theories of TEM imaging
  • Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM)
  • Chapter 5 What is high-resolution transmission electron microscopy ?.

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