Electron Nano-imaging Basics of Imaging and Diffraction for TEM and STEM /

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further deta...

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Bibliographic Details

Main Author:	Tanaka, Nobuo (Author)
Corporate Author:	SpringerLink (Online service)
Format:	Electronic eBook
Language:	English
Published:	Tokyo : Springer Japan : Imprint: Springer, 2024.
Edition:	2nd ed. 2024.
Subjects:	Materials > Microscopy. Materials > Analysis. Imaging systems. Spectrum analysis. Nanoscience. Microscopy. Imaging Techniques. Characterization and Analytical Technique. Spectroscopy. Nanophysics.
Online Access:	https://doi.org/10.1007/978-4-431-56940-4
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