Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach /
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to...
שמור ב:
| Main Authors: | , , |
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| מחבר תאגידי: | |
| פורמט: | אלקטרוני ספר אלקטרוני |
| שפה: | אנגלית |
| יצא לאור: |
Singapore :
Springer Nature Singapore : Imprint: Springer,
2023.
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| מהדורה: | 1st ed. 2023. |
| נושאים: | |
| גישה מקוונת: | https://doi.org/10.1007/978-981-19-8551-5 |
| תגים: |
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