Li, X., Yan, G., & Liu, C. (2023). Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach (1st ed. 2023.). Springer Nature Singapore : Imprint: Springer. https://doi.org/10.1007/978-981-19-8551-5

Li, Xiaowei, Guihai Yan, and Cheng Liu. Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach. 1st ed. 2023. Singapore: Springer Nature Singapore : Imprint: Springer, 2023. https://doi.org/10.1007/978-981-19-8551-5.

Li, Xiaowei, et al. Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach. 1st ed. 2023. Springer Nature Singapore : Imprint: Springer, 2023. https://doi.org/10.1007/978-981-19-8551-5.