Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach /
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to...
שמור ב:
| Main Authors: | , , |
|---|---|
| מחבר תאגידי: | |
| פורמט: | אלקטרוני ספר אלקטרוני |
| שפה: | אנגלית |
| יצא לאור: |
Singapore :
Springer Nature Singapore : Imprint: Springer,
2023.
|
| מהדורה: | 1st ed. 2023. |
| נושאים: | |
| גישה מקוונת: | https://doi.org/10.1007/978-981-19-8551-5 |
| תגים: |
הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|
תוכן הענינים:
- Chapter 1: Introduction
- Chapter 2: Fault-tolerant general circuits with 3S
- Chapter 3: Fault-tolerant general purposed processors with 3S
- Chapter 4: Fault-tolerant network-on-chip with 3S
- Chapter 5: Fault-tolerant deep learning processors with 3S
- Chapter 6: Conclusion.