Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach /

With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to...

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Bibliographic Details
Main Authors: Li, Xiaowei (Author), Yan, Guihai (Author), Liu, Cheng (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Singapore : Springer Nature Singapore : Imprint: Springer, 2023.
Edition:1st ed. 2023.
Subjects:
Online Access:https://doi.org/10.1007/978-981-19-8551-5
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