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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

This book acts as a handbook on the topic of x-ray scattering as applied to epitaxial complex oxide films, providing detailed information to collect the data, how to analyze the data and the practical sides of the experiments. The first chapter considers laboratory-based X-ray diffraction (XRD) meth...

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Opis bibliograficzny
Korporacja: SpringerLink (Online service)
Kolejni autorzy: Sando, Daniel (Redaktor), Evans, Paul G. (Redaktor), Valanoor, Nagarajan (Redaktor)
Format: Elektroniczne E-book
Język:angielski
Wydane: Singapore : Springer Nature Singapore : Imprint: Springer, 2025.
Wydanie:1st ed. 2025.
Hasła przedmiotowe:
Crystallography.
Surfaces (Physics).
Surfaces (Technology).
Thin films.
Crystallography and Scattering Methods.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Dostęp online:https://doi.org/10.1007/978-981-96-5945-6
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Spis treści:
  • Introduction to oxide thin films and context
  • Laboratory-based x-ray diffraction techniques for thin films
  • Synchrotron techniques to map ferroelectric domain structures including superlattices
  • Coherent X-ray methods
  • Magnetic scattering and dichroism techniques
  • Probing oxygen octahedra and weak ordering phenomena
  • Time-resolved x-ray scattering techniques
  • Future developments and perspectives.

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